How to perform the SOC test with reduction the development cycle time and production cost without scarifying the performance is the challenge confronted by design engineer and test engineer.
如在缩短设
周期、降低芯
成本而又不损失芯
性能的前提下完成SOC系统芯
的测试是芯
设
师和测试
师当前所要面对的挑战。