The structure and working principle of the devices for melting point measurement by means of thin film comparative method of cryoscopy were introduced.
介绍凝固点下降薄层比较法测量熔点标准物质熔点
测量装
工作原理。
The structure and working principle of the devices for melting point measurement by means of thin film comparative method of cryoscopy were introduced.
介绍凝固点下降薄层比较法测量熔点标准物质熔点测量装工作原理。
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